Jointed Child Finger Probe of IEC61032 Test Probe 18

Product Details
Customization: Available
Warranty: One Year
Customized: Non-Customized
Manufacturer/Factory & Trading Company
Gold Member Since 2013

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Number of Employees
20
Year of Establishment
1999-04-01
  • Jointed Child Finger Probe of IEC61032 Test Probe 18
  • Jointed Child Finger Probe of IEC61032 Test Probe 18
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Basic Info.

Model NO.
ZLT-I12
Structure
Portable
Material
Stainless Steel ,Nylon
Certification
CNAS Calibration Provided
Application
School, Lab
Type
Measurement Type
Usage
for Accessibility Probe Testing
MOQ
1 PC
Delivery
in 20-25 Days
Transport Package
in Aluminum Box
Specification
IEC61032 Test probe18.
Trademark
ZLTJC
Origin
Guangzhou, China
HS Code
9031809090
Production Capacity
Stock Available

Product Description

Children Finger Probe

Model :ZLT-I12

Small finger probe: Ø 8.6mm. Conform to the IEC61032 Test probe18, IEC 60065 clause 9.1.1.2. This probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.

The handle is made of nylon, tip is made of stainless steel.

Our customers:
CSA International, Asia
TÜ V Rheinland (India) Pvt. Ltd.
HA Production Quality Assurance Gr. LG Electronics Rus
Lab InchargeGrayMackenzie Engineering Services Dubai, U A E.
Jointed Child Finger Probe of IEC61032 Test Probe 18Jointed Child Finger Probe of IEC61032 Test Probe 18

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