• Jointed Child Finger Probe of IEC61032 Test Probe 18
  • Jointed Child Finger Probe of IEC61032 Test Probe 18

Jointed Child Finger Probe of IEC61032 Test Probe 18

Warranty: One Year
Customized: Non-Customized
Structure: Portable
Material: Stainless Steel ,Nylon
Certification: CNAS Calibration Provided
Application: School, Lab
Customization:
Gold Member Since 2013

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Rating: 5.0/5
Manufacturer/Factory & Trading Company

Basic Info.

Model NO.
ZLT-I12
Type
Measurement Type
Usage
for Accessibility Probe Testing
MOQ
1 PC
Delivery
in 20-25 Days
Transport Package
in Aluminum Box
Specification
IEC61032 Test probe18.
Trademark
ZLTJC
Origin
Guangzhou, China
HS Code
9031809090
Production Capacity
Stock Available

Product Description

Children Finger Probe

Model :ZLT-I12

Small finger probe: Ø 8.6mm. Conform to the IEC61032 Test probe18, IEC 60065 clause 9.1.1.2. This probe is intended to simulate access to hazardous parts by children of more than 36 months and less than 14 years.

The handle is made of nylon, tip is made of stainless steel.

Our customers:
CSA International, Asia
TÜ V Rheinland (India) Pvt. Ltd.
HA Production Quality Assurance Gr. LG Electronics Rus
Lab InchargeGrayMackenzie Engineering Services Dubai, U A E.
Jointed Child Finger Probe of IEC61032 Test Probe 18Jointed Child Finger Probe of IEC61032 Test Probe 18

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