IEC61032 Figure 13 Test Probe for Reliable Machine Testing

Product Details
Customization: Available
Warranty: One Year
Customized: Non-Customized
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Number of Employees
20
Year of Establishment
1999-04-01
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
  • IEC61032 Figure 13 Test Probe for Reliable Machine Testing
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Basic Info.

Model NO.
ZLT-I13
Material
Stainless Steel ,Nylon
Certification
CNAS Calibration Provided
Application
School, Lab
Type
Access and Object Probes
Usage
Test Protection Against Access to Hazardous Part
MOQ
1 PC
Delivery
in 20-25 Days
Transport Package
in Aluminum Box
Specification
IEC61032 Test probe19
Trademark
ZLTJC
Origin
Guangzhou, China
HS Code
9031809090
Production Capacity
Stock Available

Packaging & Delivery

Package Size
65.00cm * 14.00cm * 10.00cm
Package Gross Weight
2.000kg

Product Description

Children Test Finger Probe A

Model : ZLT-I13

Small finger probe: Ø 5.6mm. Conform to the IEC61032 Test probe19. This probe is intended to simulate access to hazardous parts by children of 36 months or less. The handle is made of nylon, tip is made of stainless steel.

Our customers:
CSA International, Asia
TÜ V Rheinland (India) Pvt. Ltd.
VICTRONIC TECHNOLOGY CORPORATION
 
Model
Standard
ZLT-I12
IEC61032 Test Probe 18
ZLT-I3
IEC61032 Test Probe 19
Technical Requirement    
1 451.6±0.8 464.3±0.8
2 101.6±0.3 101.6±0.3
3 57.9±0.15 44±0.15
4 R4.3±0.05 R2.8±0.05
5 8.6±0.1 5.6±0.1
6 38.1±0.3 25.4±0.2
7 38.4±0.3 25.9±0.2
8 451.6±0.8 464.3±0.8
9 101.6±0.3 101.6±0.3
10 57.9±0.15 44±0.15
IEC61032 Figure 13 Test Probe for Reliable Machine TestingIEC61032 Figure 13 Test Probe for Reliable Machine TestingIEC61032 Figure 13 Test Probe for Reliable Machine TestingIEC61032 Figure 13 Test Probe for Reliable Machine TestingIEC61032 Figure 13 Test Probe for Reliable Machine Testing

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